Kumar, Ashutosh and Kumar Kakanur, Yashavantha and Biradar, Suma and Desai, Srinivas A. and Satisha, T. N. and Patel, Bhumika N. and Deepak, D. A. and Tigga, Aman (2019) Studies on Genetic Variability Parameter under Artificial Epiphytotic Condition for Leaf Rust in Bread Wheat (Triticum aestivum L.). Current Journal of Applied Science and Technology, 38 (6). pp. 1-7. ISSN 2457-1024
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Abstract
Present investigation was conducted to study the genetic variability for grain yield, its component traits and slow rusting component in advanced backcross segregating lines of bread wheat at AICRP on wheat, MARS, UAS, Dharwad, Karnataka during Rabi season of 2015-2016. The study revealed highly significant differences for the yield, its component traits and for slow rusting components, indicating the presence of sufficient genetic variability in these lines which is basis for the effective selection in any breeding programme. High genotypic coefficient of variation (GCV) and phenotypic coefficient of variation (PCV) values coupled with high heritability and high genetic advance over mean were recorded for some of the studied traits such as grain yield per plant and no. of productive tillers per plant. Also high PCV and GCV along with high heritability and high genetic advance over mean (GAM) was found for the slow rusting components. The presence of sufficient variability along with high heritability for all these traits indicates that simple phenotypic selection for these traits may be effective for genetic improvement of these traits. Hence based on present findings it can be concluded that practicing selection considering the traits like productive tillers per plant, grain yield per plant along with slow rusting components will be more beneficial for achieving durable type of resistance in future breeding programme.
Item Type: | Article |
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Subjects: | East Asian Archive > Multidisciplinary |
Depositing User: | Unnamed user with email support@eastasianarchive.com |
Date Deposited: | 04 Apr 2023 12:03 |
Last Modified: | 02 Aug 2025 04:03 |
URI: | http://authors.go2articles.com/id/eprint/422 |